STRESSTECH RESIDUAL STRESS TESTING SYSTEMS
The Strestech’s Group range of equipment, based on X-ray diffraction and hole-drilling, are offered for measuring residual stresses and retained austenite contents, X-ray stress analyzer (X-ray diffractometer).
Description
The Xstress 3000 measures the stresses imposed on crystallite material by X-ray, based on the phenomenon known as Braggs Law.
The Stresstech Group also offers a Prism residual stress system, based on hole-drilling technique, for residual stress measurements. Prism dramatically increases the speed of data acquisition over the traditional strain gauge hole-drilling technique of measuring residual stress.